Tom Karygiannis is a senior computer security researcher at the National Institute of Standards and Technology. His responsibilities include developing standards, metrics, tests, and validation tools to promote, measure, and validate security systems, particularly for new and emerging technologies. As a senior researcher at NIST, Tom has conducted research in secure electronic commerce, wireless security, network intrusion detection, mobile device security, RFID security, and ad hoc network security. Tom has served on expert panels organized by DHS, DNI, DARPA, NSF, the Department of Commerce Office of Technology Policy, the White House Office of Science and Technology Policy (OSTP), the Department of Transportation, the Defense Information Systems Agency, and the National Security Council’s Critical Infrastructure Protection Office. Tom holds a Ph.D. in Computer Science from the George Washington University and a Master and Bachelor of Science degree in Electrical Engineering from Bucknell University. Tom is a co-author of NIST SP-800-163 Vetting the Security of Mobile Applications.